Technology Innovation Through Patent Examination
Saturday, August 7, 2010
Limited Technology Overview Sample Report
The following analysis is now available from IC Microanalysis LLC:
The
Limited Technology Overview
is a low-level review and summary of the patent of interest, including:
Background of the invention
Problem the invention solves
How the invention solves the problem
Different embodiments
Elements of the independent claims
http://www.icmicroanalysis.com/preliminarytechnologyoverview.htm
Download a Sample Report
No comments:
Post a Comment
Thank you for your Comments!
Newer Post
Older Post
Home
Subscribe to:
Post Comments (Atom)
No comments:
Post a Comment
Thank you for your Comments!